Vadzo Imaging Unveils World’s First 13MP Autofocus USB 3.2 Gen 2×2 Camera for High-Speed Industrial Imaging

Ultra Fast 20Gbps USB 3.2 Gen 2×2 Camera Type C | Onsemi AR1335 Color Camera | ROI Based Autofocus and Auto Exposure | ...
IEEE

Defect Detection in Patterned Wafers Using Dynamic Local Adaptive Sensitivity Adjustment

Abstract: In the defect detection of patterned wafers, optical images captured by inspection systems are affected by various noises, resulting in low signal-to-noise ratios in the obtained images, ...
Detroit Free Press

Vadzo Imaging Launches Next-Generation 20MP Monochrome USB 3.2 Gen 2×2 UVC Camera Based on Onsemi Hyperlux™ LP AR2020

Powered by Infineon FX20 and Onsemi HyperLux AR2020, Vajra-2020MRS streams uncompressed 20 MP over USB-C, delivering low-latency 5K-class imaging on native UVC without PCIe frame grabbers.” — Ashu ...
Semiconductor Engineering

Catching Critical Defects In TSVs And Stacked Chips

Variation is becoming a bigger problem in multi-die assemblies with TSVs and hybrid bonding. Multi-modal approaches are required to test these devices. AI plays a role in improving defect capture rate ...
Game Rant

How to Defect & Destroy the One True Flag in Helldivers 2

Jake Fillery is an Evergreen Editor for GameRant who has been writing lists, guides, and reviews since 2022. With thousands of engaging articles and guides, Jake loves conversations surrounding all ...
IEEE

UnfoldDet: Advancing Surface Defect Detection with Dual Feature Separation and Relation Reasoning

Abstract: Surface Defect Detection (SDD) aims to accurately localize defects based on predefined category labels in industrial manufacturing. Different from generic object detection, the industrial ...