Abstract: Automatic detection technology for steel pipe weld defects is an important and challenging task in the field of computer vision. Due to the irregularity of the shape, size, distribution area ...
Abstract: The requirement of trustable and precise defect detection in Printed Circuit Boards (PCBs) remains a challenge in the industrial setting. Often certain microscopic anomalies that are ...
Ultra Fast 20Gbps USB 3.2 Gen 2×2 Camera Type C | Onsemi AR1335 Color Camera | ROI Based Autofocus and Auto Exposure | ...
PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
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