In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...
insights from industryMatt Nowell & Michael Hassel ShearerProduct Manager Product ManagerEDAX Gatan In this interview, Matt Nowell, the EBSD product manager at EDAX, and Michael Hassel Shearer, ...
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