Business Wire

Keysight Enables Dynamic Test on a Wide-Bandgap Power Semiconductor Bare Chip

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS) has enhanced its double-pulse test portfolio enabling customers to benefit from accurate and easy measurement of the ...
Semiconductor Engineering

Better ATPG To Minimize Chip Test Time And Cost

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...
EDN

System-level test’s expanding role in producing complex chips

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
Semiconductor Engineering

Same Chip, Two Destinies: How Power Profiles Improve With On-Chip Monitoring

What happens to critical power-related considerations when the same chip is handled two different ways, with or without visibility from within? This article begins by examining how the absence of ...